The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...
What is CTL, and why is it important to the semiconductor industry? The answers are here. Although the IEEE 1450.0 Stand-ard Test Interface Language (STIL) was adopted in March 1999, widespread ...
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